Title :
Diagnosability of Nonlinear Circuits and Systems—Part II: Dynamical Systems
Author :
Saeks, Richard ; Sangiovanni-Vincentelli, Alberto ; Visvanathan, V.
Author_Institution :
Department of Electrical Engineering, Texas Tech University
Abstract :
A theory for the diagnosability of nonlinear dynamical systems, similar to the one in Part I[1] for memoryless systems, is developed. It is based on an input-output model of the system in a Hilbert space setting. A necessary and sufficient condition for the local diagnosability of the system, which is a rank test on a matrix, is derived. A simple sufficient condition is also derived. It is shown that, for locally diagnosable systems, there exist a finite number of test inputs that are sufficient to diagnose the system. Illustrative examples are presented.
Keywords :
Adjoint map; Frechet derivative; Hilbert space; dynamical systems; local diagnosability; measure; Circuit faults; Circuit testing; Circuits and systems; Extraterrestrial measurements; Hilbert space; Memoryless systems; Nonlinear circuits; Nonlinear dynamical systems; Sufficient conditions; System testing; Adjoint map; Frechet derivative; Hilbert space; dynamical systems; local diagnosability; measure;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.1675721