Ion source and stripper gas cell developments for the 6 MeV tandem heavy ion beam probe on the Large Helical Device

Author

Taniike, A. ; Sasao, M. ; Fujisawa, A. ; Iguchi, H. ; Hamada, Y. ; Fujita, J. ; Wada, M. ; Mori, Y.

Author_Institution

Graduate Univ. for Adv. Studies, Nagoya, Japan

Volume

22

Issue

4

fYear

1994

fDate

8/1/1994 12:00:00 AM

Firstpage

430

Lastpage

434

Abstract

The feasibility of a heavy ion beam with a tandem acceleration system for plasma potential measurement has been examined. A plasma-sputter-type ion source which produces an Au^- beam with an energy width as small as 6 eV and a reasonably small emittance of π mm-mrad (MeV)^½, can be used for this purpose. Suitable target gas thickness for a charge exchange is estimated to be less than 10¹⁵ atom/cm² at the 3 MV terminal voltage

Keywords

acceleration; charge exchange; ion beams; ion sources; plasma diagnostics; plasma probes; plasma toroidal confinement; plasma-beam interactions; 3 MV; 6 MeV; 6 MeV tandem heavy ion beam probe; 6 eV; Au; Au^- beam; charge exchange; emittance; energy width; ion source; large helical device; plasma potential measurement; plasma-sputter-type ion source; stripper gas cell; tandem beam acceleration system; target gas thickness; terminal voltage; Acceleration; Accelerometers; Gold; Ion beams; Ion sources; Particle beams; Plasma accelerators; Plasma measurements; Plasma sources; Voltage;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/27.310651

Filename

310651