• DocumentCode
    1143536
  • Title

    A New Look at the Bistatic-to-Monostatic Conversion for Tandem SAR Image Formation

  • Author

    Ding, Jinshan ; Zhang, Zhenhua ; Xing, Mengdao ; Bao, Zheng

  • Author_Institution
    Nat. Key Lab. for Radar Signal Process., Xidian Univ., Xi´´an
  • Volume
    5
  • Issue
    3
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    392
  • Lastpage
    395
  • Abstract
    The bistatic synthetic aperture radar (SAR) data, which are converted into equivalent monostatic data by proper preprocessing, can be processed by standard monostatic focusing algorithms. The dip moveout (DMO) approach, which is derived from seismic data processing, converts the bistatic data into equivalent monostatic data by a short time-domain Rocca´s smile operator. A 2D exact point-target (PT) reference spectrum is derived in this letter for the tandem bistatic configuration. The geometry-based bistatic formulation is shown to be actually equivalent to Rocca´s smile operator, although they are derived from the pure SAR and geophysics points of view, respectively. Moreover, the new PT spectrum can be extended to deal with azimuth-invariant bistatic SAR data. Interpretations on the equivalent monostatic range wavenumber are presented in this letter, which help understand the conversion from the radar signal processing viewpoint.
  • Keywords
    geophysical signal processing; radar signal processing; synthetic aperture radar; 2D exact point-target reference spectrum; azimuth-invariant bistatic SAR data; bistatic synthetic aperture radar; bistatic-to-monostatic conversion; dip moveout approach; monostatic focusing algorithms; radar signal processing; seismic data processing technique; tandem SAR image formation; tandem bistatic configuration; time-domain Rocca smile operator; Bistatic synthetic aperture radar (Bi-SAR); dip moveout (DMO); geometry-based bistatic formula (GBF); point-target (PT) spectrum; tandem configuration;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2008.916645
  • Filename
    4497778