DocumentCode
1143641
Title
Defect Level as a Function of Fault Coverage
Author
Williams, T.W. ; Brown
Author_Institution
General Technology Division, IBM
Issue
12
fYear
1981
Firstpage
987
Lastpage
988
Abstract
This correspondence presents a single equation relating the defect level of LSI chips to the yield and stuck-at-fault coverage with some assumptions. It is assumed that the faults occur randomly on the chips, which implies no clustering. This concept is extended to modules on boards.
Keywords
Fault coverage; stuck-at-fault; testing; yield; Costs; Equations; Large scale integration; Manufacturing; Probability density function; Testing; Very large scale integration; Yield estimation; Fault coverage; stuck-at-fault; testing; yield;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1981.1675742
Filename
1675742
Link To Document