Title :
Defect Level as a Function of Fault Coverage
Author :
Williams, T.W. ; Brown
Author_Institution :
General Technology Division, IBM
Abstract :
This correspondence presents a single equation relating the defect level of LSI chips to the yield and stuck-at-fault coverage with some assumptions. It is assumed that the faults occur randomly on the chips, which implies no clustering. This concept is extended to modules on boards.
Keywords :
Fault coverage; stuck-at-fault; testing; yield; Costs; Equations; Large scale integration; Manufacturing; Probability density function; Testing; Very large scale integration; Yield estimation; Fault coverage; stuck-at-fault; testing; yield;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.1675742
