Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits

Author

Liaw, Chi-chang ; Su, Stephen Y H ; Malaiya, Yashwant K.

Author_Institution

Research Group on Design Automation and Fault-Tolerant Computing, School of Advanced Technology, State University of New York

Issue

12

fYear

1981

Firstpage

989

Lastpage

995

Abstract

Practical solutions have not been obtained from the previous papers addressing the problem of testing intermittent faults in sequential circuits. Existing methods are only suitable for small sequential circuits. This correspondence presents a new technique to design test-experiments for intermittent faults which can conveniently be used for relatively more complex synchronous sequential circuits.

Keywords

Dynamic programming; fault detection; fault diagnosis; fault location; integer programming; intermittent faults; ordering of test sequences; repetitive testing; sequential circuits; simulation; test experiments; transient faults; Circuit faults; Circuit simulation; Circuit testing; Clocks; Combinational circuits; Electrical fault detection; Fault detection; Linear programming; Sequential analysis; Sequential circuits; Dynamic programming; fault detection; fault diagnosis; fault location; integer programming; intermittent faults; ordering of test sequences; repetitive testing; sequential circuits; simulation; test experiments; transient faults;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/TC.1981.1675743

Filename

1675743