Title :
Underfill viscous flow between parallel plates and solder bumps
Author :
Young, Wen-Bin ; Yang, Wen-Lin
Author_Institution :
Dept. of Aeronaut. & Astronaut., Nat. Cheng-Kung Univ., Tainan, Taiwan
fDate :
12/1/2002 12:00:00 AM
Abstract :
Underfill is used to improve the reliability of the flip-chip interconnect systems. A conventional underfill is filled to the gap between the chip and substrate around the solder joints by capillary flow. A modified Hele-Shaw flow, that considered the flow resistance in both the thickness direction and the restrictions between solder bumps, was used. This model estimates the flow resistance induced by the chip and substrate as well as the solder bumps, and provides a reasonable flow front prediction as compared to the experimental observations. A method to simulate the edge effects during the underfill process was also proposed, which gave a close flow front prediction in a chip assembly with full array solders.
Keywords :
capillarity; encapsulation; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; viscosity; Hele-Shaw flow; capillary flow; edge effects; flip-chip interconnect systems; flow front prediction; flow resistance; parallel plates; reliability; solder bumps; thickness direction; underfill viscous flow; Assembly; Equations; Filling; Helium; Information technology; Joining materials; Polymers; Predictive models; Soldering; Thermal stresses;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2002.806176