DocumentCode
1144629
Title
An Information Theoretic Approach to Digital Fault Testing
Author
Agrawal, Vishwani D.
Author_Institution
Bell Laboratories
Issue
8
fYear
1981
Firstpage
582
Lastpage
587
Abstract
The concepts of information theory are applied to the problem of testing digital circuits. By analyzing the information throughput of the circuit an expression for the probability of detecting a hardware fault is derived. Examples are given to illustrate an application of the present study in designing efficient pattern generators for testing.
Keywords
Logic testing; statistical communication theory; statistical testing; test generation; Circuit analysis; Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Hardware; Information analysis; Information theory; Throughput; Logic testing; statistical communication theory; statistical testing; test generation;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1981.1675843
Filename
1675843
Link To Document