DocumentCode
1144637
Title
Fault Diagnosis in a Boolean n Cube Array of Microprocessors
Author
Armstrong, J.R. ; Gray, F.G.
Author_Institution
Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia
Issue
8
fYear
1981
Firstpage
587
Lastpage
590
Abstract
Fault- tolerant characteristics of a Boolean n cube array of microprocessors are analyzed. Connectivity properties of the network graph are used to show that n processor or link failures are required to isolate a processor. For processor failures the network is shown to be n (one step) diagnosable. A testing algorithm is presented which can diagnose up to n processor failures.
Keywords
Array; diagnosability; fault tolerance; faults; microprocessor; network; Application software; Circuit testing; Digital systems; Entropy; Fault diagnosis; Information analysis; Information theory; Microprocessors; Signal analysis; Software testing; Array; diagnosability; fault tolerance; faults; microprocessor; network;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1981.1675844
Filename
1675844
Link To Document