Title :
Fault Diagnosis in a Boolean n Cube Array of Microprocessors
Author :
Armstrong, J.R. ; Gray, F.G.
Author_Institution :
Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia
Abstract :
Fault- tolerant characteristics of a Boolean n cube array of microprocessors are analyzed. Connectivity properties of the network graph are used to show that n processor or link failures are required to isolate a processor. For processor failures the network is shown to be n (one step) diagnosable. A testing algorithm is presented which can diagnose up to n processor failures.
Keywords :
Array; diagnosability; fault tolerance; faults; microprocessor; network; Application software; Circuit testing; Digital systems; Entropy; Fault diagnosis; Information analysis; Information theory; Microprocessors; Signal analysis; Software testing; Array; diagnosability; fault tolerance; faults; microprocessor; network;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.1675844
