Title :
Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults
Author :
Malaiya, Yashwant K. ; Su, Stephen Y H
Author_Institution :
Research Group on Design Automation and Fault-Tolerant Computing, School of Advanced Technology, State University of New York
Abstract :
While significant results are available which allow estimation of reliability measure for systems with permanent faults, no generally applicable results are available for intermittent (transient) faults. Methods are presented here which allow reliability evaluation for systems with both intermittent and permanent faults. Two reliability measures, instantaneous and durational reliabilities, are defined and methods to compute them are given. Computed results for the durational reliability for various redundancy schemes are compared.
Keywords :
Fault-tolerant design; Markov model; fault-tolerant system; hardware redundancy; intermittent faults; modeling of faults; multiple faults; permanent faults; reconfiguration scheme; reliability analysis; reliability evaluation; transient faults; Circuit faults; Clocks; Digital systems; Fault tolerant systems; Hardware; PROM; Redundancy; Sequential circuits; Switching circuits; Very large scale integration; Fault-tolerant design; Markov model; fault-tolerant system; hardware redundancy; intermittent faults; modeling of faults; multiple faults; permanent faults; reconfiguration scheme; reliability analysis; reliability evaluation; transient faults;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.1675847
