DocumentCode :
1144788
Title :
Guest Editors´ Comments
Author :
Butler, J.T. ; Wojcik, A.S.
Issue :
9
fYear :
1981
Firstpage :
617
Lastpage :
618
Abstract :
MULTIPLE-VALUED logic has been the subject of considerable study during the past decade [1]-[3]. Indeed, there has been an annual symposium devoted exclusively to the subject since 1971. The Proceedings of these annual symposia provide a historical perspective to the developments in multiple-valued logic. Initially, researchers were most concerned with such problems as the determination of functionally complete sets of logical operators, functional minimization, and other switching theoretic and logical design problems. Only a few worked on the implementation of multiple-valued logic circuits [4], [5]. Another problem, which still exists, is functional representation. While the truth table for a 10 input m-valued function is inconveniently large for m = 2, it is intractably large for m > 2; and algebraic expressions for even relatively simple multiple-valued functions are typically quite complex.
Keywords :
Charge coupled devices; Circuit testing; Computer aided manufacturing; Fuzzy logic; Integrated circuit interconnections; Logic circuits; Logic devices; Logic testing; Read only memory; Very large scale integration;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1981.1675859
Filename :
1675859
Link To Document :
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