DocumentCode
1145139
Title
An X-Band Focussed-Beam Interferometer for Plasma Diagnostics
Author
Engler, P.E.
Author_Institution
Cornell Aeronautical Lab., Inc., Buffalo, N. Y. 14221
Issue
3
fYear
1971
fDate
5/1/1971 12:00:00 AM
Firstpage
551
Lastpage
553
Abstract
A microwave interferometer which permits the measurement of phase shift in a plasma independent of propagation path attenuation over a 30-dB dynamic range is described. Results are presented from an experimental evaluation of measurement accuracy of the interferometer instrument.
Keywords
Attenuation; Fluctuations; Klystrons; Phase measurement; Phase modulation; Phase shifting interferometry; Plasma confinement; Plasma diagnostics; Plasma measurements; Plasma sources;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9251
Type
jour
DOI
10.1109/TAES.1971.310300
Filename
4103748
Link To Document