Title :
Effective on-chip inductance modeling for multiple signal lines and application to repeater insertion
Author :
Cao, Yu ; Huang, Xuejue ; Chang, Norman H. ; Lin, Shen ; Nakagawa, O. Sam ; Xie, Weize ; Sylvester, Dennis ; Hu, Chenming
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
Abstract :
/sup A/ new approach to handle inductance effects for multiple signal lines is presented. The worst-case switching pattern is first identified. Then a numerical approach is used to model the effective loop inductance (L/sub eff/) for multiple lines. Based on a look-up table for L/sub eff/, an equivalent single line model can be generated to decouple a specific signal line from the others to perform static timing analysis. Compared to the use of full RLC netlists for multiple lines, this approach greatly improves the computational efficiency and maintains accuracy for timing and signal integrity analysis. We apply these models to repeater insertion in critical paths and find that, for a single line, the RLC model minimizes delay with fewer number of repeaters than RC model. However, for multiple lines, we find that same number of repeaters is inserted for optimal delay according to both the RC and RLC models.
Keywords :
RC circuits; RLC circuits; VLSI; circuit optimisation; circuit simulation; delays; equivalent circuits; inductance; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; repeaters; table lookup; timing; RC model; RLC model; accuracy; computational efficiency; critical paths; delay; effective loop inductance; equivalent single line model; look-up table; multiple signal lines; on-chip inductance modeling; repeater insertion; signal integrity analysis; static timing analysis; worst-case switching pattern; Accuracy; Computational efficiency; Delay; Inductance; Performance analysis; Repeaters; Signal analysis; Signal generators; Table lookup; Timing;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2002.808426