Accurate Substrate Analysis Based on a Novel Finite Difference Method via Synchronization Method on Layered and Adaptive Meshing

Author

Youngae Han ; Jinsong Zhao

Author_Institution

Cadence Design Syst., San Jose, CA, USA

Volume

32

Issue

10

fYear

2013

fDate

Oct. 2013

Firstpage

1520

Lastpage

1532

Abstract

In this paper, we present a finite difference method (FDM) based on layered and adaptive meshing to extract substrate resistance. To allow adaptive meshing, a novel synchronization method is introduced which expresses the potential at other points than the centroids of panels by modifying the finite difference equations. This method makes it possible to overcome the high computational cost of the FDM due to tight uniform meshing requirements while enjoying a straightforward implementation and easy handling of irregular/arbitrary substrate structures to extract the substrate coupling of integrated circuits.

Keywords

finite difference methods; integrated circuit design; mesh generation; substrates; synchronisation; FDM; adaptive meshing; computational cost; finite difference method; integrated circuits; irregular-arbitrary substrate structures; layered meshing; substrate analysis; substrate coupling; substrate resistance; synchronization method; tight uniform meshing requirements; Equations; Finite element analysis; Frequency division multiplexing; Green´s function methods; Resistance; Substrates; Synchronization; Combined FDM/FEM; Rao–Wilton–Glisson basis; finite difference method; isolation; pulse basis; substrate analysis; synchronization method;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2013.2261437

Filename

6600985