DocumentCode :
1146115
Title :
Special issue on nonvolatile memory reliability
Volume :
51
Issue :
11
fYear :
2004
Firstpage :
1939
Lastpage :
1939
Abstract :
Provides notice of upcoming special issues of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2004.838610
Filename :
1347416
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1146115
