DocumentCode
1146344
Title
Comparative study of MR head designs with abutted vs. overlaid permanent magnet bias
Author
Shen, Y. ; Chen, W. ; Jensen, W. ; Ravipati, D. ; Retort, V. ; Rottmayer, R. ; Rudy, S. ; Tan, S. ; Yuan, S.
Author_Institution
Read-Rite Corp., Fremont, CA, USA
Volume
32
Issue
1
fYear
1996
fDate
1/1/1996 12:00:00 AM
Firstpage
19
Lastpage
24
Abstract
We have developed Soft-Adjacent-Layer (SAL)-biased MR head products with two types of permanent magnet (PM) domain stabilization schemes, namely, abutted and overlaid. Both types of MR heads are capable of achieving recording density of 500 Mb/in2 with linear bit densities ranging from 100-118 kbpi. While transfer curves with a transverse sweeping field showed similar behavior for both PM schemes, the overlaid structure has a large hysteresis in its transfer curve under a longitudinal sweeping field while the abutted junction was hysteresis free. Micromagnetic modeling showed that the hysteresis for the overlaid scheme arises from the varying field response of the MR element in the active region, under the leads and under the PM. Magnetic test shows that the abutted MR head with a PM defined TW had a slower rise in sensitivity and had an effectively narrower magnetic track width. On the other hand, the overlaid MR head with an active region defined by the leads with MR under them has a steeper rise in sensitivity, a broadened magnetic read track and side readings
Keywords
magnetic domains; magnetic heads; magnetoresistive devices; permanent magnets; sensitivity; soft magnetic materials; MR head designs; abutted permanent magnet bias; active region; domain stabilization schemes; linear bit densities; longitudinal sweeping field; magnetic track width; micromagnetic modeling; overlaid permanent magnet bias; recording density; sensitivity; side readings; soft-adjacent-layer-biased heads; transverse sweeping field; Antiferromagnetic materials; Lead; Magnetic films; Magnetic heads; Magnetic hysteresis; Magnetic materials; Magnetic shielding; Micromagnetics; Permanent magnets; Testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.477544
Filename
477544
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