• DocumentCode
    1146376
  • Title

    Narrow track MR head technology

  • Author

    Ishiwata, Nobuyuki ; Ishi, Tsutomu ; Matsutera, Hisao ; Yamada, Kazhiko

  • Author_Institution
    Functional Devices Res. Labs., NEC Corp., Tokyo, Japan
  • Volume
    32
  • Issue
    1
  • fYear
    1996
  • fDate
    1/1/1996 12:00:00 AM
  • Firstpage
    38
  • Lastpage
    42
  • Abstract
    Narrow track technologies for shielded MR heads are discussed in terms of off-track performance and increased head output. Permanent magnet bias heads are increasingly superior to exchange coupling bias heads as tracks become narrower, because of the excellent off-track performance of the permanent magnet type. Increasing the sense current is one way to increase head output. However, the current increase raises the temperature of the MR element and degrades performance. An analysis of the thermal behavior of the shielded MR head shows that increasing the thermal conduction of the shield and gap layers, which are the main sources of heat radiation, and improving the crystalline properties of the Ni-Fe film effectively suppress the rise in temperature of the MR element
  • Keywords
    iron alloys; magnetic heads; magnetic shielding; magnetoresistive devices; nickel alloys; permanent magnets; NiFe; crystalline properties; gap layers; head output; heat radiation; narrow track technologies; off-track performance; permanent magnet bias; shielded MR heads; thermal behavior; thermal conduction; Antiferromagnetic materials; Couplings; Interference; Magnetic analysis; Magnetic flux; Magnetic heads; Magnetization; Permanent magnets; Temperature sensors; Thermal conductivity;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.477547
  • Filename
    477547