Title :
New Large Short-Circuit Testing Generators [includes discussion]
Author_Institution :
FELLOW AIEE, General Electric Company, Schenectady, N. Y.
Keywords :
Absorption; Circuit testing; Coils; Conductors; Corona; Insulation testing; Ionization; Iron; Polarization; Probes;
Journal_Title :
Power Apparatus and Systems, Part III. Transactions of the American Institute of Electrical Engineers
DOI :
10.1109/AIEEPAS.1952.4498546
