DocumentCode :
1146504
Title :
Background and Methodology for Analyzing Step and Touch Potentials near Transmission Structures Part I Background
Author :
Niles, G. B. ; Baishiki, R. ; Cartwright, J. W. ; Dawalibi, Farid ; Dick, W. K. ; Eisinger, W. G. ; Engimann, J. G. ; Finney, W. G. ; Heh, R. J. ; Hubbard, D. C. ; Jones, D. T. ; Lam, H. T. ; Nichols, D. J. ; Parker, H. ; Quinn, P. D. ; Ralston, R.
Volume :
1
Issue :
2
fYear :
1986
fDate :
4/1/1986 12:00:00 AM
Firstpage :
150
Lastpage :
157
Abstract :
This paper provides background Information for analyzing step and touch potentials near transmission structures. A companion paper provides engineering evaluation for analyzing these potentials.
Keywords :
Circuit faults; Conductors; Design engineering; Fault currents; Grounding; Information analysis; Poles and towers; Substations; Transmission lines; Voltage;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/TPWRD.1986.4307945
Filename :
4307945
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1146504
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