Buried optical waveguide polarizer by titanium indiffusion and proton-exchange in LiNbO/sub 3/

Author

Jiang, Pisu ; Zhou, Feng ; Laybourn, P.J.R. ; De La Rue, R.M.

Author_Institution

Dept. of Electron. & Electr. Eng., Glasgow Univ., UK

Volume

4

Issue

8

fYear

1992

Firstpage

881

Lastpage

883

Abstract

Buried optical waveguide polarizers on LiNbO/sub 3/ have been realized by titanium indiffusion, followed by proton-exchange and annealing. The proton-exchange process decreases the ordinary refractive index and so modifies the index profile of the titanium indiffused waveguide. The measured intensity profile is in good agreement with calculation. An aluminum film absorbs the surface TM mode on z-cut LiNbO/sub 3/, leaving a buried nearly symmetric TE mode with lower optical loss than surface-guided TE modes. The extinction ratio obtained is estimated to be greater than 50 dB/cm at 0.633 mu m.<>

Keywords

diffusion in solids; integrated optics; ion exchange; lithium compounds; optical polarisers; optical waveguides; optical workshop techniques; 0.633 micron; Al film absorbtion; LiNbO/sub 3/; Ti indiffusion; annealing; buried nearly symmetric TE mode; buried optical waveguide polariser; extinction ratio; index profile; indiffused waveguide; intensity profile; optical loss; ordinary refractive index; proton-exchange; refractive index; surface TM mode; z-cut; Annealing; Optical films; Optical polarization; Optical refraction; Optical surface waves; Optical variables control; Optical waveguides; Refractive index; Tellurium; Titanium;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.149895

Filename

149895