Title :
The Reliability of Memory with Single-Error Correction
Author :
Mikhail, W.F. ; Bartoldus, R.W. ; Rutledge, R.A.
Author_Institution :
IBM Corporation
fDate :
6/1/1982 12:00:00 AM
Abstract :
This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.
Keywords :
Error-correcting codes; fault-tolerant systems; memory reliability; semiconductior memory; single-error correction; Differential equations; Error analysis; Error correction; Error correction codes; Fault tolerant systems; Semiconductor device measurement; Semiconductor device reliability; Semiconductor memory; Error-correcting codes; fault-tolerant systems; memory reliability; semiconductior memory; single-error correction;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1982.1676042
