DocumentCode :
1146767
Title :
An optimization design method for chemically amplified resist process control
Author :
Pan, ShaoWei ; Reilly, Michael T. ; Di Fabrizio, Enzo ; Leonard, Quinn ; Taylor, James Welch ; Cerrina, Franco
Author_Institution :
Integrated Syst. Center, Gen. Instrum. Corp., Phoenix, AZ, USA
Volume :
7
Issue :
3
fYear :
1994
fDate :
8/1/1994 12:00:00 AM
Firstpage :
325
Lastpage :
332
Abstract :
A novel optimization method called chemically-amplified resist process optimization design (CARPOD) applicable to the chemically amplified resist (CAR) process development is described. The method finds the optimal process conditions and the design center (maximum process tolerance space) of a CAR process with minimum experimental runs. First a modified response surface method is used to form the numerical response surface of a CAR, and its most sensitive point, which is the minimum requirement of X-ray dose, is located as an optimal process condition by an optimization method called POSM under the constraint of the contrast of the photoresist. Second, the design center is found to maximize the process tolerance space around the optimal process condition. Third, verifications are made on the optimal design as well as the design center. The process optimization of AZ PF-514 has been used as an example to show that the CARPOD method can identify the optimal process condition as well as the maximum tolerable parameter space with minimum experimental runs
Keywords :
X-ray lithography; design engineering; integrated circuit manufacture; optimisation; photoresists; process control; AZ PF-514; CARPOD; IC fabrication; POSM; X-ray dose; X-ray photoresists; chemically amplified resist process control; design center; maximum process tolerance space; modified response surface method; numerical response surface; optimal process conditions; optimization design method; Chemical processes; Design for experiments; Design methodology; Design optimization; Lithography; Optimization methods; Process control; Process design; Resists; Response surface methodology;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.311336
Filename :
311336
Link To Document :
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