Title :
Totally Self-Checking Checker for 1-out-of-n Code Using Two-Rail Codes
Author_Institution :
Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford. University
fDate :
7/1/1982 12:00:00 AM
Abstract :
A new design for a totally self-checking 1-out-of-n checker is presented. A comparison with other existing methods [1], [10] is given. It is shown that for many practical values of n the new scheme requires less hardware and/or is faster than the other methods. The entire checker can be tested by applying all of the n possible 1-out-of-n inputs.
Keywords :
1-out-of-n code; Checker; code disjoint; programmable logic array (PLA) totally self-checking (TSC); two-rail code; Built-in self-test; Circuit faults; Decoding; Encoding; Hardware; Java; Logic devices; Military computing; Programmable logic arrays; Testing; 1-out-of-n code; Checker; code disjoint; programmable logic array (PLA) totally self-checking (TSC); two-rail code;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1982.1676065
