Title :
Random and systematic uncertainties of reflection-type Q-factor measurement with network analyzer
Author_Institution :
Dept. of Electr. Eng., Univ. of Mississippi, University, MS, USA
Abstract :
The reflection-type measurement of the unloaded Q factor of microwave resonant cavities consists of measuring the complex reflection coefficient with a network analyzer as a function of frequency and fitting the measured data to a circle on a complex plane. The measurement errors are of two kinds: random errors caused by imperfect data fit to an ideal circle and systematic errors caused by the limited accuracy of the network analyzer and its accessories. This paper presents the methods for estimating the measurement uncertainties for both kinds of errors.
Keywords :
Q-factor measurement; cavity resonators; curve fitting; electromagnetic wave reflection; error analysis; measurement errors; microwave measurement; network analysers; complex plane circle; complex reflection coefficient; imperfect data fit; limited network analyzer accuracy; measured data fitting; measurement errors; measurement uncertainties; microwave resonant cavities; network analyzer; network analyzer accessories; random errors; random uncertainties; reflection-type Q-factor measurement; systematic errors; systematic uncertainties; unloaded Q factor; Coupling circuits; Equivalent circuits; Fitting; Frequency measurement; Microwave measurements; Performance analysis; Performance evaluation; Q factor; Reflection; Resonant frequency;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2002.807831
