• DocumentCode
    1147233
  • Title

    Absorbing boundary conditions for adjoint problems in the design sensitivity analysis with the FDTD method

  • Author

    Rickard, Yotka S. ; Georgieva, Natalia K. ; Tam, Helen W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
  • Volume
    51
  • Issue
    2
  • fYear
    2003
  • Firstpage
    526
  • Lastpage
    529
  • Abstract
    In this paper, absorbing boundary conditions (ABCs) for adjoint problems with a backward time variable are derived from first principles. It is shown that all single-layer ABCs for the adjoint backward time problem, which are based on the one-way wave equation, have the same form as for the original forward time problem. In the case of the adjoint perfectly matched layer (PML) ABC, the signs before the spatial derivatives are opposite to those in the PML ABC of the original forward time problem. To verify the theoretical findings, the numerical reflections from the adjoint ABCs are investigated in a microstrip-line example. The reflections from the ABCs of the forward- and backward time schemes are shown to be identical for the same type of ABCs.
  • Keywords
    boundary-value problems; electromagnetic wave absorption; electromagnetic wave reflection; finite difference time-domain analysis; microstrip lines; network synthesis; sensitivity analysis; ABC reflections; FDTD method; PNM ABC; absorbing boundary conditions; adjoint backward time problem; adjoint perfectly matched layer ABC; design sensitivity analysis; finite-difference time-domain method; forward time problem; microstrip line; numerical reflections; one-way wave equation; single-layer ABC; spatial derivatives; Boundary conditions; Finite difference methods; Maxwell equations; Microstrip; Partial differential equations; Perfectly matched layers; Reflection; Sensitivity analysis; Shape; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2002.807840
  • Filename
    1179422