Title :
Probabilistic Short-Circuit Uprating of Station Strain Bus System - Reliability and Operating Considerations
Author :
Ramani, N. ; Wang, L. ; Tanaka, W.H. ; Macedo, F.X.
Author_Institution :
Ontario Hydro, Toronto, Canada
Abstract :
A probabilistic approach to the short-circuit current uprating of station strain bus system has been described in two companion papers [1,2]. This paper discusses the impact of using this approach on (1) the reliability of supply to low voltage buses at tapped stations, (2) the probability of operating the bulk electricity system in high risk states, and (3) the operating security after occurrences of contingencies involving strain bus failures. It was found that probabilistic uprating would not significantly affect the above system performance parameters.
Keywords :
Capacitive sensors; Circuits; Frequency measurement; Low voltage; Power measurement; Power system reliability; Power system security; Substations; System performance; Thermal stability;
Journal_Title :
Power Delivery, IEEE Transactions on
DOI :
10.1109/TPWRD.1986.4308041