DocumentCode :
1147438
Title :
Probabilistic Short-Circuit Uprating of Station Strain Bus System - Reliability and Operating Considerations
Author :
Ramani, N. ; Wang, L. ; Tanaka, W.H. ; Macedo, F.X.
Author_Institution :
Ontario Hydro, Toronto, Canada
Volume :
1
Issue :
4
fYear :
1986
Firstpage :
137
Lastpage :
141
Abstract :
A probabilistic approach to the short-circuit current uprating of station strain bus system has been described in two companion papers [1,2]. This paper discusses the impact of using this approach on (1) the reliability of supply to low voltage buses at tapped stations, (2) the probability of operating the bulk electricity system in high risk states, and (3) the operating security after occurrences of contingencies involving strain bus failures. It was found that probabilistic uprating would not significantly affect the above system performance parameters.
Keywords :
Capacitive sensors; Circuits; Frequency measurement; Low voltage; Power measurement; Power system reliability; Power system security; Substations; System performance; Thermal stability;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/TPWRD.1986.4308041
Filename :
4308041
Link To Document :
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