An Easily Testable Design of Programmable Logic Arrays for Multiple Faults

In this paper, the problem of fault detection for multiple faults in programmable logic arrays (PLA´s) is discussed. An easily testable design of PLA´s has been proposed which has the following properties: 1) for a PLA with n inputs, m product terms, there exists a test set such that the test patterns do not depend on the function realized by the PLA; 2) the number of tests to detect multiple stuck type and cross point faults is m(2n + 1) + 4n + 4; 3) the number of additional pins for the testable design is 3; 4) the design philosophy is compatible with the built-in-testing approaches.