Title :
An Efficient Approach for Fault Diagnosis in a Boolean n-Cube Array of Microprocessors
Author :
Bhat, Kabekode V.S.
Author_Institution :
Department of Computer Science, University of Iowa
Abstract :
In this correspondence a O(n3)-time algorithm for fault diagnosis in an n-cube connected array of processors is presented using the notion of candidate processors and syndrome information digraphs.
Keywords :
Candidate processors; distributed processing; efficient algorithms; fault diagnosis; n-cube connected arrays; syndrome information digraph; Cities and towns; Computer science; Distributed processing; Fault diagnosis; Fault tolerant systems; Microprocessors; Testing; Candidate processors; distributed processing; efficient algorithms; fault diagnosis; n-cube connected arrays; syndrome information digraph;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1983.1676161