DocumentCode :
1147862
Title :
Holographic interferometry measurement of the thermal refractive index coefficient and the thermal expansion coefficient of Nd:YAG and Nd:YALO
Author :
Young, Daniel D. ; Jungling, Kenneth C. ; Williamson, Tom L. ; Nichols, Elgene R.
Author_Institution :
Electro-Optics Device Branch, Air Force Avionics Laboratory, Wright-Patterson AFB, Ohio
Volume :
8
Issue :
8
fYear :
1972
fDate :
8/1/1972 12:00:00 AM
Firstpage :
720
Lastpage :
721
Abstract :
Accurate values for the thermal expansion coefficient α and the thermal coefficient of refractive index 
are important in the design of a solid-state laser. This paper presents values of α and that were measured for Nd:YAG and Nd:YALO by a single-exposure holographic interferometry technique. The value of α for Nd:YAG agrees closely with that reported before, yet significantly different values of for Nd:YAG and α for Nd: YALO were obtained. A discussion of the measurement techniques is given.
are important in the design of a solid-state laser. This paper presents values of α and that were measured for Nd:YAG and Nd:YALO by a single-exposure holographic interferometry technique. The value of α for Nd:YAG agrees closely with that reported before, yet significantly different values of for Nd:YAG and α for Nd: YALO were obtained. A discussion of the measurement techniques is given.Keywords :
Copper; Holography; Interferometry; Laser beams; Laser modes; Optical design; Ovens; Refractive index; Solid lasers; Thermal expansion;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1972.1077267
Filename :
1077267
Link To Document :
