A self-calibration technique for monolithic high-resolution D/A converters

Author

Groeneveld, D. Wouter J ; Schouwenaars, Hans J. ; Termeer, Henk A H ; Bastiaansen, Cornelis A A

Author_Institution

Philips Res. Lab., Eindhoven, Netherlands

Volume

24

Issue

6

fYear

1989

fDate

12/1/1989 12:00:00 AM

Firstpage

1517

Lastpage

1522

Abstract

A self-calibration technique based upon charge storage on the gate-source capacitance of CMOS transistors is presented. The technique can produce multiple copies of a reference current. Therefore, it is suitable for the calibration of high-resolution D/A (digital/analog) converters which are based upon equal current sources. As the storage capacitor is internal, no external components are required. A calibrated spare current source is used to allow continuous converter operation. This implies that no special calibration cycles are required. To show the capabilities of the calibration technique, it was implemented in a 16-b D/A converter. Measurement results show a total harmonic distortion of 0.0025% at a power consumption of 20 mW and a minimum supply voltage of 3 V. The design was fabricated in a 1.6-μm double-metal CMOS process without special options

Keywords

CMOS integrated circuits; calibration; digital-analogue conversion; 1.6 micron; 3 V; CMOS transistors; D/A converters; calibrated spare current source; charge storage; continuous converter operation; double-metal CMOS process; gate-source capacitance; high-resolution; minimum supply voltage; monolithic DAC; power consumption; reference current; self-calibration technique; storage capacitor; Analog-digital conversion; CMOS process; Calibration; Capacitance; Capacitors; Distortion measurement; Energy consumption; Power measurement; Total harmonic distortion; Voltage;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.44987

Filename

44987