Title :
Thermal testing using oscillation based test structures
Author :
Novak, F. ; Zarnik, M.S.
Author_Institution :
Jozef Stefan Inst., Ljubljana, Slovenia
fDate :
1/23/2003 12:00:00 AM
Abstract :
With slight modification, the oscillation based test structures originally implemented for a go-no-go test can also be used for thermal testing. The idea is described in a case study of the lowpass Sallen and Key filter and the notch filter. The approach can be generalised to the oscillation based test structures of other types of analogue circuits.
Keywords :
RC circuits; active filters; analogue circuits; circuit oscillations; circuit testing; low-pass filters; notch filters; Sallen-Key filter; active RC filters; analogue circuits; lowpass filter; notch filter; oscillation based test structures; temperature dependant component; thermal testing; thermistor;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030123
