DocumentCode
1148121
Title
Testing by Verifying Walsh Coefficients
Author
Susskind, Alfred K.
Author_Institution
Department of Electrical and Computer Engineering, Lehigh University
Issue
2
fYear
1983
Firstpage
198
Lastpage
201
Abstract
Testing of logic networks by verifying the Walsh coefricients of the outputs is explored. Measurement of one of these can detect arbitrarily many input leads stuck, and just two measurements, requiring little hardware, can detect any single stuck-at fault in appropriately designed networks.
Keywords
Exhaustive testing; Walsh functions; fault detection; multiple fault detection; short testing; syndrome testing; testable design; testing; truth-table verification; Arithmetic; Art; Circuit faults; Circuit testing; Computer networks; Electrical fault detection; Fault detection; Logic testing; Programming; Very large scale integration; Exhaustive testing; Walsh functions; fault detection; multiple fault detection; short testing; syndrome testing; testable design; testing; truth-table verification;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1983.1676204
Filename
1676204
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