• DocumentCode
    114823
  • Title

    Electronic state transition in cooperatively interacting point-defects in semiconductor crystals

  • Author

    Mohamed, Mahmoud A. ; Majlis, Burhanuddin Yeop ; Ani, M.H.

  • Author_Institution
    Inst. of Microeng. & Nanoelectron., Nat. Univ. of Malaysia, Bangi, Malaysia
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    252
  • Lastpage
    254
  • Abstract
    Electron state transition of deep level point defects in a semiconductor crystal was studied. Low-temperature grown GaAs produced excess antisite As (AsGa) which produces localized spin when doped with Be. A nearly abrupt decrease of 1.7% of the resistance is detected at a temperature around 4 K which is consistent with abrupt decrease of magnetization. These observations are explained as a result of cooperative transition of electron states of AsGa defects. First-principal calculations of the electron state of an AsGa atom with a shallow acceptor Be show that at the transition an AsGa+ ion is displaced to the interstitial site and becomes a neutral atom and finally results in formation of a hole producing enhancement in conductivity.
  • Keywords
    III-V semiconductors; ab initio calculations; antisite defects; beryllium; deep levels; electrical conductivity; electrical resistivity; gallium arsenide; impurity states; interstitials; magnetic semiconductors; magnetisation; semiconductor doping; GaAs:Be; cooperatively interacting point-defects; deep level point defects; doping; electrical conductivity; electrical resistance; electronic state transition; excess antisite; first-principal calculations; hole producing enhancement; interstitial site; localized spin; low-temperature growth; magnetization; neutral atom; semiconductor crystals; shallow acceptor; Crystals; Electrical resistance measurement; Gallium arsenide; Magnetization; Resistance; Temperature; Temperature measurement; LT-GaAs; Molecular Beam Epitaxy; antisite As;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics (ICSE), 2014 IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Type

    conf

  • DOI
    10.1109/SMELEC.2014.6920844
  • Filename
    6920844