Title :
Potential buildup in samples charged by successive low-energy pulses
Author :
Ferreira, G.F.Leal ; Figueiredo, M.T.
Author_Institution :
Inst. de Fisica e Quimica de Sao Carlos, Sao Paulo Univ., Brazil
fDate :
8/1/1994 12:00:00 AM
Abstract :
We present a calculation for the charging of a dielectric sample submitted in open circuit to a series of consecutive, identical, electron pulses of low energy. The calculation is based on deep trap kinematics and takes full account of space charge effects. Electric field profiles and the potential buildup after n⩽10 pulses are presented, allowing one to infer the important parameter μτ of the material (μ the mobility and τ the trapping time). A comparison with the results of a simple calculation which neglects space charge effects is also given
Keywords :
dielectric materials; electron beam effects; electron traps; space charge; static electrification; surface potential; deep trap kinematics; dielectric sample; electric field profiles; low-energy pulses; potential buildup; space charge effects; trapping time; Conductivity; Delay; Dielectrics; Electron traps; Equations; Kinematics; Permittivity; Pulse circuits; Pulse generation; Space charge;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
