• DocumentCode
    1148556
  • Title

    Nonvolatile Magnetic Flip-Flop for Standby-Power-Free SoCs

  • Author

    Sakimura, Noboru ; Sugibayashi, Tadahiko ; Nebashi, Ryusuke ; Kasai, Naoki

  • Author_Institution
    Device Platforms Labs., NEC Corp., Sagamihara, Japan
  • Volume
    44
  • Issue
    8
  • fYear
    2009
  • Firstpage
    2244
  • Lastpage
    2250
  • Abstract
    This paper presents a new nonvolatile magnetic flip-flop (MFF) for standby-power-critical applications. An MFF primitive cell for design libraries has been developed using 150 nm, 1.5 V CMOS and 240 nm MRAM processes. It has advantages over other nonvolatile flip-flops in high-speed store operations without endurance limitations. It also has high design compatibility with conventional CMOS LSI designs because it does not include any additional power lines and special transistors. A toggle frequency of 3.5 GHz was achieved by a SPICE simulation, which is comparable to that of a normal CMOS DFF in the same generation. The maximum frequency in a store operation was also estimated to be 500 MHz with 1-ns current width for the data backup. An MFF test chip, which includes 16-stage 8-bit shift register using MFFs, was fabricated with these processes. A 333 MHz store operation was measured without failed bits. The functional performance was sufficiently high to demonstrate the potential of MFFs, which helps to reduce the power dissipation of systems on chips (SoCs) dramatically.
  • Keywords
    CMOS integrated circuits; SPICE; flip-flops; silicon-on-insulator; MFF primitive cell; SPICE simulation; frequency 500 MHz to 3.5 GHz; nonvolatile magnetic flip-flop; power dissipation; size 150 nm to 240 nm; standby-power-free SoC; voltage 1.5 V; CMOS process; Flip-flops; Frequency estimation; Large scale integration; Libraries; Power dissipation; SPICE; Semiconductor device measurement; Shift registers; Testing; MRAM; nonvolatile flip-flops; standby-power reduction;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2009.2023192
  • Filename
    5173764