Title :
Channel temperature measurement of PHEMT by means of optical probes
Author :
Savian, D. ; Carlo, A. Di ; Lugli, P. ; Peroni, M. ; Cetronio, C. ; Lanzieri, C. ; Meneghesso, G. ; Zanoni, E.
Author_Institution :
Dept. of Electr. Eng., Univ. of Rome, Roma, Italy
fDate :
1/23/2003 12:00:00 AM
Abstract :
A novel technique for precise temperature measurement of high power PHEMTs is presented. The method, based on the measurement of photogenerated current, is used to extract the temperature of the PHEMT channel. Evaluation of thermal resistance is presented.
Keywords :
photoconductivity; power HEMT; probes; semiconductor device measurement; temperature measurement; thermal resistance; channel temperature measurement; high power PHEMT; optical probe; photocurrent spectra; thermal resistance;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030135
