Calculation and Adjustment Limitation of Four-Parameter TRV in High Power Testing Circuits and Their Comparison

This paper presents a method for analysis and calculation of 4-parameter transient recovery voltage (TRV) and its adjustment limitation and two sets of formulae for determination of electrical component parameters, relying on nondimensional presentation of TRV requirements and circuit parameters, to obtain accurate TRV waveforms complying with IEC standard in three kinds of testing circuits used in high-power laboratories. The results show that choosing suitable testing circuit and adopting some applicable measures could greatly save the capacitive energy needed in Weil-synthetic testing circuits and increase the injection-current frequencies, which are imperative at UHV levels.