DocumentCode :
1148825
Title :
Performance of thin-film chip resistors
Author :
Bos, Larry
Author_Institution :
Int. Resistive Co., Corpus Christi, TX, USA
Volume :
17
Issue :
3
fYear :
1994
fDate :
9/1/1994 12:00:00 AM
Firstpage :
359
Lastpage :
365
Abstract :
Increased use of thin-film surface mount chip resisters in military and high-performance industrial equipment has led to an increased awareness of potential failure modes in harsh environments. In this work, we have studied the behavior of chip resistors fabricated from tantalum nitride and nichrome metal films under biased humidity and have measured widely different results attributable to the metal film, and protective system. The effects of electrostatic discharge (ESD) and high-temperature stability on these small resistive devices was also examined and related to the resistor design
Keywords :
chromium alloys; electron device testing; electrostatic discharge; humidity; nickel alloys; stability; surface mount technology; tantalum compounds; thin film resistors; ESD; NiCr; SMD; TaN; biased humidity; electrostatic discharge; failure modes; harsh environments; high-temperature stability; metal film; protective system; resistor design; surface mount chip resisters; thin-film chip resistors; Defense industry; Electrostatic discharge; Electrostatic measurements; Humidity measurement; Military equipment; Protection; Resistors; Semiconductor device measurement; Stability; Transistors;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.311744
Filename :
311744
Link To Document :
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