DocumentCode
1148894
Title
A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits
Author
Virupakshia, A.R. ; Reddy, V. C V Pratapa
Author_Institution
Department of Electrical Engineering, Indian Institute of Technology
Issue
6
fYear
1983
fDate
6/1/1983 12:00:00 AM
Firstpage
594
Lastpage
597
Abstract
This paper suggests a method for near-optimal selection of input vector probabilities for random testing of intermittent faults in combinational circuits. The assignment of input vector probabilities is obtained by equalizing the quality factors of all test vectors in a simple way. It is shown that the degree of fault detection is comparable with that of Savir [2].
Keywords
Combinational circuits; intermittent fault detection; random testing; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fluctuations; Humidity; Q factor; Stress; Temperature; Combinational circuits; intermittent fault detection; random testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1983.1676283
Filename
1676283
Link To Document