DocumentCode :
1148916
Title :
Never say die [integrated circuit tests]
Author :
Baines, Sunny
Volume :
51
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
44
Lastpage :
48
Abstract :
Perfection is an illusion - even integrated circuits that pass all tests at birth can lose their abilities in old age. New research is looking at ways of stopping so many chips ending up on the scrap heap. The paper looks at whether escalating gate counts on integrated circuits will make the fault-free chip an unrealisable ideal, and what this would mean for computer architectures.
Keywords :
computer architecture; field programmable gate arrays; integrated circuit testing; logic gates; logic testing; FPGA; computer architectures; fault-free chip; gate counts; integrated circuit tests;
fLanguage :
English
Journal_Title :
IEE Review
Publisher :
iet
ISSN :
0953-5683
Type :
jour
DOI :
10.1049/ir:20050606
Filename :
1499163
Link To Document :
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