Title :
A Self-Test Hardwired Control Section
Author :
Miczo, Alexander
Author_Institution :
Large Information Systems Division, Honeywell Information Systems
fDate :
7/1/1983 12:00:00 AM
Abstract :
A fault detect mechanism is described for hardwired control logic. The mechanism takes advantage of inherent redundancy in the control logic design style which assigns a unique flip-flop to each machine state. The mechanism is capable of detecting all single stuck-at faults, as well as many multiple faults and intermittents within the control section.
Keywords :
Control section; fault detection; fault diagnosis; self-test; Built-in self-test; Fault detection; Fault diagnosis; Fault tolerance; Flip-flops; Information systems; Interference; Logic design; Multiprocessing systems; Redundancy; Control section; fault detection; fault diagnosis; self-test;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1983.1676302
