• DocumentCode
    1149091
  • Title

    A Self-Test Hardwired Control Section

  • Author

    Miczo, Alexander

  • Author_Institution
    Large Information Systems Division, Honeywell Information Systems
  • Issue
    7
  • fYear
    1983
  • fDate
    7/1/1983 12:00:00 AM
  • Firstpage
    695
  • Lastpage
    696
  • Abstract
    A fault detect mechanism is described for hardwired control logic. The mechanism takes advantage of inherent redundancy in the control logic design style which assigns a unique flip-flop to each machine state. The mechanism is capable of detecting all single stuck-at faults, as well as many multiple faults and intermittents within the control section.
  • Keywords
    Control section; fault detection; fault diagnosis; self-test; Built-in self-test; Fault detection; Fault diagnosis; Fault tolerance; Flip-flops; Information systems; Interference; Logic design; Multiprocessing systems; Redundancy; Control section; fault detection; fault diagnosis; self-test;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1983.1676302
  • Filename
    1676302