DocumentCode
1149091
Title
A Self-Test Hardwired Control Section
Author
Miczo, Alexander
Author_Institution
Large Information Systems Division, Honeywell Information Systems
Issue
7
fYear
1983
fDate
7/1/1983 12:00:00 AM
Firstpage
695
Lastpage
696
Abstract
A fault detect mechanism is described for hardwired control logic. The mechanism takes advantage of inherent redundancy in the control logic design style which assigns a unique flip-flop to each machine state. The mechanism is capable of detecting all single stuck-at faults, as well as many multiple faults and intermittents within the control section.
Keywords
Control section; fault detection; fault diagnosis; self-test; Built-in self-test; Fault detection; Fault diagnosis; Fault tolerance; Flip-flops; Information systems; Interference; Logic design; Multiprocessing systems; Redundancy; Control section; fault detection; fault diagnosis; self-test;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1983.1676302
Filename
1676302
Link To Document