Title :
Test vehicle for a wafer-scale thermal pixel scene simulator
Author :
Chapman, G.H. ; Carr, L.S. ; Syrzycki, M.J. ; Dufort, B.
Author_Institution :
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
fDate :
8/1/1994 12:00:00 AM
Abstract :
A chip sized test vehicle has been created to experiment with the technology and design required for two wafer scale thermal pixel displays: a thermal pixel dynamic scene simulator and a visual-to-thermal converter. The 4.7×4.7 mm device contains a 2×4 array of micromachined thermal pixels, optical detectors, A/D converters, digital pixel control circuitry, and laser links for interconnection. Laser produced defect avoidance schemes allowed testing and harvesting for global redundancy of the control circuitry and local transducer substitution. Also the laser linked signal buses flexibility was used to arrange the chip in different thermal pixel display configurations. Two chips were laser interconnected, one as fabricated and another where anisotropic etching had created a suspended plate holding the polysilicon resistor thermal pixels. From the electrical and laser interconnection points of operation there was no difference between the etched and unetched circuits
Keywords :
VLSI; display devices; image convertors; infrared imaging; integrated circuit testing; optical interconnections; packaging; redundancy; silicon; simulation; A/D converters; Si; anisotropic etching; chip sized test vehicle; digital pixel control circuitry; dynamic scene simulator; global redundancy; laser linked signal buses; laser links for interconnection; laser produced defect avoidance schemes; micromachined thermal pixels; optical detectors; polysilicon resistor; suspended plate; thermal pixel displays; visual-to-thermal converter; wafer-scale thermal pixel scene simulator; Circuit simulation; Circuit testing; Displays; Etching; Integrated circuit interconnections; Layout; Optical arrays; Optical control; Sensor arrays; Vehicle dynamics;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on