DocumentCode :
1149317
Title :
Changing states of delamination between molding compound and chip surface: a challenge for scanning acoustic microscopy
Author :
Tilgner, R. ; Alpern, P. ; Baumann, J. ; Pfannschmidt, G. ; Selig, O.
Author_Institution :
Siemens AG, Munich, Germany
Volume :
17
Issue :
3
fYear :
1994
fDate :
8/1/1994 12:00:00 AM
Firstpage :
442
Lastpage :
448
Abstract :
The states of the interface chip/molding compound under temperature cycling stress are described by a simple model. This interface is usually evaluated nondestructively by means of scanning acoustic microscopy (SAM). Applying the well known theory of elastic waves to rough interfaces we are able to predict some restrictions in sensitivity of SAM in this case. The reason is that acoustical bridges within gaps play a crucial role in observing delaminations between chip and molding compound. As a consequence, one is led to the conclusion that there are types of delaminations which cannot be detected by SAM. Experimental results are presented which show this
Keywords :
acoustic microscopy; delamination; encapsulation; life testing; SAM; acoustical bridges; chip surface; delamination; elastic waves; encapsulation; molding compound; rough interfaces; scanning acoustic microscopy; temperature cycling stress; Aluminum; Delamination; Nonhomogeneous media; Plastics; Silicon; Temperature; Thermal degradation; Thermal stresses; Thermomechanical processes; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.311795
Filename :
311795
Link To Document :
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