• DocumentCode
    1149317
  • Title

    Changing states of delamination between molding compound and chip surface: a challenge for scanning acoustic microscopy

  • Author

    Tilgner, R. ; Alpern, P. ; Baumann, J. ; Pfannschmidt, G. ; Selig, O.

  • Author_Institution
    Siemens AG, Munich, Germany
  • Volume
    17
  • Issue
    3
  • fYear
    1994
  • fDate
    8/1/1994 12:00:00 AM
  • Firstpage
    442
  • Lastpage
    448
  • Abstract
    The states of the interface chip/molding compound under temperature cycling stress are described by a simple model. This interface is usually evaluated nondestructively by means of scanning acoustic microscopy (SAM). Applying the well known theory of elastic waves to rough interfaces we are able to predict some restrictions in sensitivity of SAM in this case. The reason is that acoustical bridges within gaps play a crucial role in observing delaminations between chip and molding compound. As a consequence, one is led to the conclusion that there are types of delaminations which cannot be detected by SAM. Experimental results are presented which show this
  • Keywords
    acoustic microscopy; delamination; encapsulation; life testing; SAM; acoustical bridges; chip surface; delamination; elastic waves; encapsulation; molding compound; rough interfaces; scanning acoustic microscopy; temperature cycling stress; Aluminum; Delamination; Nonhomogeneous media; Plastics; Silicon; Temperature; Thermal degradation; Thermal stresses; Thermomechanical processes; Transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.311795
  • Filename
    311795