Title :
The PDF projection theorem and the class-specific method
Author :
Baggenstoss, Paul M.
Author_Institution :
Naval Undersea Warfare Center, Newport, RI, USA
fDate :
3/1/2003 12:00:00 AM
Abstract :
We present the theoretical foundation for optimal classification using class-specific features and provide examples of its use. A new probability density function (PDF) projection theorem makes it possible to project probability density functions from a low-dimensional feature space back to the raw data space. An M-ary classifier is constructed by estimating the PDFs of class-specific features, then transforming each PDF back to the raw data space where they can be fairly compared. Although statistical sufficiency is not a requirement, the classifier thus constructed becomes equivalent to the optimal Bayes classifier if the features meet sufficiency requirements individually for each class. This classifier is completely modular and avoids the dimensionality curse associated with large complex problems. By recursive application of the projection theorem, it is possible to analyze complex signal processing chains. We apply the method to feature sets, including linear functions of independent random variables, cepstrum, and Mel cepstrum. In addition, we demonstrate how it is possible to automate the feature and model selection process by direct comparison of log-likelihood values on the common raw data domain.
Keywords :
Bayes methods; parameter estimation; signal classification; statistical analysis; M-ary classifier; Mel cepstrum; PDF estimation; PDF projection theorem; class-specific features; complex signal processing chains; feature sets; independent random variables; linear functions; log-likelihood values; optimal Bayes classifier; optimal classification; probability density function projection theorem; recursive methods; statistical sufficiency; Cepstral analysis; Cepstrum; Hidden Markov models; Maximum likelihood estimation; Pattern classification; Probability density function; Random variables; Signal analysis; Signal processing; Statistics;
Journal_Title :
Signal Processing, IEEE Transactions on
DOI :
10.1109/TSP.2002.808109