DocumentCode :
1149400
Title :
Ellipse rotation studies in laser host materials
Author :
Owyoung, Adelbert
Author_Institution :
Sandia Laboratories, Albuquerque, NM, USA
Volume :
9
Issue :
11
fYear :
1973
fDate :
11/1/1973 12:00:00 AM
Firstpage :
1064
Lastpage :
1069
Abstract :
Using a TEM00qnear Gaussian mode ruby laser system we report the first experimental measurements of intensity induced changes of optical polarization (ellipse rotation) in a cubic crystalline medium, YAG, for which we obtain the nonlinear susceptibilities \\chi _{3}^{1221} (- \\omega , \\omega , \\omega , -\\omega ) = 6.34 \\times 10^{-15} ESU and frac{1}{2} (\\chi _{3}^{1111} + \\chi _{3}^{1221} - 2\\chi _{3}^{1212}) = 7.18 \\times 10^{-15} ESU, accurate to better than ±7 percent relative to \\chi _{3}^{1221} (- \\omega ,\\omega ,\\omega , -\\omega ) for liquid CS2. These values are compared with further results obtained for fused quartz and two laser glasses. Moreover, by time resolving the ellipse rotation data we demonstrate the capability to plot ellipse rotation versus input power on a single laser shot, thus increasing the practical feasibility of the technique and introducing the possibility of resolving transient contributions to the measurement.
Keywords :
Crystalline materials; Crystallization; Glass; Laser modes; Laser transitions; Nonlinear optics; Optical materials; Optical polarization; Power lasers; Rotation measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1973.1077417
Filename :
1077417
Link To Document :
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