• DocumentCode
    1149400
  • Title

    Ellipse rotation studies in laser host materials

  • Author

    Owyoung, Adelbert

  • Author_Institution
    Sandia Laboratories, Albuquerque, NM, USA
  • Volume
    9
  • Issue
    11
  • fYear
    1973
  • fDate
    11/1/1973 12:00:00 AM
  • Firstpage
    1064
  • Lastpage
    1069
  • Abstract
    Using a TEM00qnear Gaussian mode ruby laser system we report the first experimental measurements of intensity induced changes of optical polarization (ellipse rotation) in a cubic crystalline medium, YAG, for which we obtain the nonlinear susceptibilities \\chi _{3}^{1221} (- \\omega , \\omega , \\omega , -\\omega ) = 6.34 \\times 10^{-15} ESU and frac{1}{2} (\\chi _{3}^{1111} + \\chi _{3}^{1221} - 2\\chi _{3}^{1212}) = 7.18 \\times 10^{-15} ESU, accurate to better than ±7 percent relative to \\chi _{3}^{1221} (- \\omega ,\\omega ,\\omega , -\\omega ) for liquid CS2. These values are compared with further results obtained for fused quartz and two laser glasses. Moreover, by time resolving the ellipse rotation data we demonstrate the capability to plot ellipse rotation versus input power on a single laser shot, thus increasing the practical feasibility of the technique and introducing the possibility of resolving transient contributions to the measurement.
  • Keywords
    Crystalline materials; Crystallization; Glass; Laser modes; Laser transitions; Nonlinear optics; Optical materials; Optical polarization; Power lasers; Rotation measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1973.1077417
  • Filename
    1077417