Title :
A Theory of Totally Self-Checking System Design
Author :
Smith, James E. ; Lam, Paklin
Author_Institution :
Department of Electrical and Computer Engineering, University of Wisconsin-Madison
Abstract :
A totally self-checking digital system uses error detecting codes at subsystem interfaces to detect faults before they can lead to harmful undetected errors. This paper develops a formal model for studying totally self-checking systems.
Keywords :
Checker placement; detecting codes; error propagation; fault secure; self-testing; totally self-checking systems; Application software; Circuit faults; Circuit synthesis; Computer errors; Electrical fault detection; Fault detection; Integrated circuit reliability; Logic circuits; System analysis and design; Telephony; Checker placement; detecting codes; error propagation; fault secure; self-testing; totally self-checking systems;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1983.1676332
