DocumentCode :
1149650
Title :
An Analysis of the Use of Rademacher–Walsh Spectrum in Compact Testing
Author :
Hsiao, Ten-chuan ; Seth, Sharad C.
Author_Institution :
Department of Electrical Engineering, California State University
Issue :
10
fYear :
1984
Firstpage :
934
Lastpage :
937
Abstract :
Earlier approaches to random compact testing use a random pattern generator which depends on the combinational function under test and a circuit signature which remains the same independent of the circuit. In this correspondence we analyze the performance of a new scheme in which the pattern generator is simple and independent of the function being tested but the circuit signature is chosen to be a coefficient from the Rademacher-Walsh (RW) spectrum of the function under test. The analysis provides guidelines for choosing an RW coefficient, a test length, and an error tolerance so as to minimize the probabilities of rejecting a good unit or accepting a faulty one.
Keywords :
Error analysis; Rademacher-Walsh coefficients; functional testing; random compact testing; Circuit faults; Circuit testing; Digital circuits; Guidelines; Input variables; Logic testing; Pattern analysis; Performance analysis; Probability; Test pattern generators; Error analysis; Rademacher-Walsh coefficients; functional testing; random compact testing;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1984.1676357
Filename :
1676357
Link To Document :
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