Title :
Comments on "Fault Diagnosis of MOS Combinational Networks"
Author :
Chiang, Kuang-wei ; Vranesic, Zvonko G.
Author_Institution :
Department of Electrical Engineering, University of Ottawa
Abstract :
This correspondence points out that the scope of application of the matrix model for MOS complex gates proposed by El-ziq and Su1does not cover general structures of this type. Also, an example is given to show that a complete detection test set for single stuck-at faults may not be able to detect all multiple faults in a fanout-free and irredundant MOS complex gate.
Keywords :
Fault detection; MOS logic circuits; test generation; Circuit faults; Circuit testing; Driver circuits; Electrical fault detection; Fault detection; Fault diagnosis; Logic circuits; Logic testing; MOSFETs; Switches; Fault detection; MOS logic circuits; test generation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.1676361
