• DocumentCode
    1149695
  • Title

    Comments on "Fault Diagnosis of MOS Combinational Networks"

  • Author

    Chiang, Kuang-wei ; Vranesic, Zvonko G.

  • Author_Institution
    Department of Electrical Engineering, University of Ottawa
  • Issue
    10
  • fYear
    1984
  • Firstpage
    947
  • Lastpage
    947
  • Abstract
    This correspondence points out that the scope of application of the matrix model for MOS complex gates proposed by El-ziq and Su1does not cover general structures of this type. Also, an example is given to show that a complete detection test set for single stuck-at faults may not be able to detect all multiple faults in a fanout-free and irredundant MOS complex gate.
  • Keywords
    Fault detection; MOS logic circuits; test generation; Circuit faults; Circuit testing; Driver circuits; Electrical fault detection; Fault detection; Fault diagnosis; Logic circuits; Logic testing; MOSFETs; Switches; Fault detection; MOS logic circuits; test generation;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1984.1676361
  • Filename
    1676361
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1149695