• DocumentCode
    1150153
  • Title

    Doppler-surface mapping technique for characterisation of spinning cylinders illuminated by radar

  • Author

    Christensen, John K. ; Underhill, Michael J.

  • Author_Institution
    Defense Sci. & Technol. Lab., Sevenoaks, UK
  • Volume
    20
  • Issue
    8
  • fYear
    2005
  • Firstpage
    19
  • Lastpage
    24
  • Abstract
    The objective of this paper is to present a new Doppler-surface mapping (D-map) technique for understanding the backscattering characteristics of broadside illuminated electrically large spinning cylindrical radar targets. The D-map technique utilises new results that indicate that for nominally axi-symmetric rotations, an asymmetric and discrete line Doppler spectrum will always be present. In essence these frequency spectra are mapped to the target surface and represented In the form of a scattering half angle. Two classes of target (metallic and dielectric) are studied at rotation rates between 1Hz and 8Hz. The technique has practical relevance since from knowing the scattering angle and target dimensions, it is possible to determine the area of the target surface contributing to the backscattered response. It is found that the target scattering angle is invariant with rotation speed. However, the scattering angle for the dielectric cylinder is 50% greater than for the metallic cylinder suggesting that the technique could be used to discriminate between targets with differing electrical (material) properties or surface roughness characteristics.
  • Keywords
    Doppler radar; backscatter; D-map technique; Doppler-surface mapping technique; backscattering characteristics; dielectric cylinder; frequency spectra; radar; scattering angle; spinning cylinders; target dimensions; Backscatter; Dielectric materials; Dielectric measurements; Doppler radar; Frequency estimation; Geometrical optics; Laboratories; Optical surface waves; Radar scattering; Spinning;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/MAES.2005.1499290
  • Filename
    1499290