• DocumentCode
    1150189
  • Title

    Reliability Evaluation of Fault-Tolerant Systems—Effect of Variability in Failure Rates

  • Author

    Iyer, Ravishankar K.

  • Author_Institution
    Science Laboratory, Department of Electrical Engineering, University of Illinois
  • Issue
    2
  • fYear
    1984
  • Firstpage
    197
  • Lastpage
    200
  • Abstract
    In this correspondence models for the variation in system reliability due to uncertainty in failure rate estimation are developed. Two techniques are proposed. The first is exact and is based on the complete distribution of the failure rate. The second is an approximation and employs only the first and second moments. The application of these models in reliability analysis is then discussed and illustrated with numerical examples.
  • Keywords
    Failure rate; Taylor approximation; fault-tolerant systems; mean and variance; Dispersion; Fault tolerant systems; Military computing; Parameter estimation; Particle measurements; Predictive models; Random variables; Reliability; Testing; Uncertainty; Failure rate; Taylor approximation; fault-tolerant systems; mean and variance;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1984.1676412
  • Filename
    1676412
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1150189