Title :
Reliability Evaluation of Fault-Tolerant Systems—Effect of Variability in Failure Rates
Author :
Iyer, Ravishankar K.
Author_Institution :
Science Laboratory, Department of Electrical Engineering, University of Illinois
Abstract :
In this correspondence models for the variation in system reliability due to uncertainty in failure rate estimation are developed. Two techniques are proposed. The first is exact and is based on the complete distribution of the failure rate. The second is an approximation and employs only the first and second moments. The application of these models in reliability analysis is then discussed and illustrated with numerical examples.
Keywords :
Failure rate; Taylor approximation; fault-tolerant systems; mean and variance; Dispersion; Fault tolerant systems; Military computing; Parameter estimation; Particle measurements; Predictive models; Random variables; Reliability; Testing; Uncertainty; Failure rate; Taylor approximation; fault-tolerant systems; mean and variance;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.1676412
