DocumentCode
1150219
Title
A tanh substitution technique for the analysis of abrupt and graded interface multilayer dielectric stacks
Author
Corzine, Scott W. ; Yan, R.H. ; Coldren, Larry A.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume
27
Issue
9
fYear
1991
fDate
9/1/1991 12:00:00 AM
Firstpage
2086
Lastpage
2090
Abstract
The authors report a new analytical technique for estimating the peak reflectivity of lossless dielectric stacks with combinations of quarter and/or half-wave thicknesses. A simple variable substitution is used to transform the standard formula for the reflectivity of a Fabry-Perot resonator into a remarkably simplified form. The resulting expressions for reflectivity are intuitively appealing, allowing use of additive algebra to calculate the peak reflectivity of a multilayer dielectric stack
Keywords
optical films; optical resonators; reflectivity; Fabry-Perot resonator; additive algebra; analytical technique; graded interface multilayer dielectric stacks; half-wave thicknesses; lossless dielectric stacks; peak reflectivity; quarter wave dielectric stack; simple variable substitution; standard formula; tanh substitution technique; Additives; Algebra; Dielectric losses; Fabry-Perot; Mirrors; Nonhomogeneous media; Optical refraction; Reflectivity;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.135163
Filename
135163
Link To Document